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[HUAN84] K. Huang and J. A. Abraham, Algorithm-Based Fault-Tolerance for Matrix Operations, IEEE Trans. Comput., C-33 (June 1984): 518 528. [HUGH84] J. L. A. Hughes, E. J. McCluskey, and D. J. Lu, Design of Totally Self-Checking Comparators with an Arbitrary Number of Inputs, IEEE Trans. Comput., C-33 (January 1984): 546 550. [ITOH80] H. Itoh and M. Nakamichi, Design of Self-Checking Checkers for Berger Code and m-out-of-n Code (in Japanese), Trans. IECE Japan, J63-D (April 1980): 326 331. [ITOH82] H. Itoh and M. Nakamichi, Self-Checking Checker Designs for Various 2-Rail Codes, Trans. IECE Japan, E65 (November 1982): 665 671. [IZAW81] N. Izawa, 3-Level Realization of Self-Checking 1-out-of-n Code Checkers (in Japanese), Dig., 1981 IECE Nat. Convention of Information Systems, IECE of Japan, 504 (October 1981). [IZAW84a] N. Izawa, Design of Totally Self-Checking Checkers for Unordered Codes (in Japanese), Trans. IECE Japan, J67-D (May 1984): 585 592. [IZAW84b] N. Izawa, Reduced-Gate Design of Totally Self-Checking Checkers for Unordered Codes (in Japanese), Trans. IECE Japan, J67-D (December 1984): 1395 1402. [JANS85] I. Jansch and B. Courtois, Strongly Language Disjoint Checking, Dig., 15th IEEE Int. Symp. on Fault-Tolerant Computing (June 1985): 390 395. [JHA84] N. K. Jha and J. A. Abraham, The Design of Totally Self-Checking Embedded Checkers, Dig., 14th IEEE Int. Symp. on Fault-Tolerant Computing (June 1984): 265 270. [KHAK82a] J. Khakbaz and E. J. McCluskey, Concurrent Error Detection and Testing for Large PLA s, IEEE J. Solid-State Circ., SC-17 (April 1982): 386 394. [KHAK82b] J. Khakbaz, Self-Testing Embedded Parity Trees, Dig., 12th IEEE Int. Symp. on Fault-Tolerant Computing (June 1982): 109 116. [KHAK82c] J. Khakbaz, Totally Self-Checking Checker for 1-out-of-n Code Using Two-Rail Codes, IEEE Trans. Comput., C-13 (July 1982): 667 681. [KHAK84] J. Khakbaz and E. J. McCluskey, Self-Testing Embedded Parity Checkers, IEEE Trans. Comput., C-33 (August 1984): 753 794. [KHOD79] B. Khodadad-Mostershiry, Parity Prediction in Combinational Circuit, Dig., 9th IEEE Int. Symp. on Fault-Tolerant Computing (June 1979): 185 188. [KONE80] B. Konemann, J. Mucha, and G. Zwiehoff, Built-in Test for Complex Digital Integrated Circuits, IEEE J. Solid-State Circ., SC-15 (June 1980): 315 319. [KORE86] I. Koren and D. K. Pradhan, Yield and Performance Enhancement Through Redundancy in VLSI and WSI Multiprocessor Systems, Proc. IEEE, 74 (May 1986): 699 711. [KROL86] T. Krol, (N, K) Concept Fault Tolerance, IEEE Trans. Comput., C-35 (April 1986): 339 349. [LALA85] P. K. Lala, Fault Tolerant and Fault Testable Hardware Design, Prentice-Hall (1985). [LALA01] P. K. Lala, Self-Checking and Fault-Tolerant Digital Design, Morgan Kaufmann (2001). [LANG70] G. G. Langdon Jr. and C. K. Tang, Concurrent Error Detection for Group Look-Ahead Binary Adders, IBM J. Res. Dev., 14 (September 1970): 563 573. [LO87a] J. C. Lo and S. Thanwastien, The Design of Fast Totally Self-Checking Berger Codes Checkers Based on Berger Code Partitioning, Research Paper, University of Southwestern Louisiana, Lafayette (March 25, 1987). (Also in Dig., 18th IEEE Int. Symp. on Fault-Tolerant Computing [June 1988].) [LO87b] J. C. Lo and S. Thanawastien, On the Design of Combinational Totally Self-Checking 1-out-of-3 Code Checkers, Research Paper, University of Southwestern Louisiana, Lafayette (May 25, 1987). [MACC85] E. J. McCluskey, Built-In Self-Test Techniques, Built-In Self-Test Structures, IEEE Design Test, 2 (April 1985): 21 28, 29 36.
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[MAK82] G. P. Mak, J. A. Abraham, and E. S. Davidson, The Design of PLAs with Concurrent Error Detection, Dig., 12th IEEE Int. Symp. on Fault-Tolerant Computing (June 1982): 303 310. [MAKI74] G. Maki and D. H. Sawain III, Fault-Tolerant Asynchronous Sequential Machines, IEEE Trans. Comput., C-23 (July 1974): 651 657. [MAND72] D. Mandelbaum, Error Correction in Residue Arithmetic, IEEE Trans. Comput., C-21 (June 1972): 538 545. [MARO78a] M. A. Marouf and A. D. Friedman, Design of Self-Checking Checkers for Berger Codes, Dig., 8th IEEE Int. Symp. on Fault-Tolerant Computing (1978): 179 184. [MARO78b] M. A. Marouf and A. D. Friedman, Ef cient Design of Self-Checking Checker for Any m-out-of-n Code, IEEE Trans. Comput., C-27 (June 1978): 482 490. [MCIN05] H. McIntyre, D. Wendell, K. J. Lin, P. Kaushik, S. Seshadri, A. Wang, V. Sundararaman, P. Wang, S. Kim, W-J. Hsu, H-C. Park, G. Levinsky, J. Lu, M. Chirania, R. Heald, P. Lazar, and S. Dharmasena, A 4-MB On-Chip L2 Cache for a 90-nm 1.6-GHz 64-Bit Microprocessor, IEEE J. Solid-State Circ., 40 (January 2005): 52 59. [MONT72] P. M. Monteiro and T. R. N. Rao, A Residue Checker for Arithmetic and Logical Operations, Dig., 12th IEEE Int. Symp. on Fault-Tolerant Computing (June 1972): 8 13. [MOUR86a] S. Mourad, J. L. A. Hughes, and E. J. McCluskey, Multiple Fault Detection in Parity Trees, Proc. IEEE Compcon Spring (1986): 441 444. [MOUR86b] S. Mourad, J. L. A. Hughes, and E. J. McCluskey, Stuck-at Fault Detection in Parity Trees, Proc. IEEE Fall Joint Computer Conf. (September 1986): 836 840. [MUEL99] M. Mueller, L. C. Alves, W. Fisher, M. L. Fair, and I. Modi, RAS Strategy for IBM S/390 G5 and G6, IBM J. Res. Dev., 43 (September November 1999): 875 888. [MUKA74] Y. Mukai and Y. Tohma, A Method for the Realization of Fail-Safe Asynchronous Sequential Circuits, IEEE Trans. Comput., C-23 (July 1974): 736 739. [MUKA76] Y. Mukai and Y. Tohma, A Masked-Fault Free Realization of Fail-Safe Asynchronous Sequential Circuits, Dig., 6th IEEE Int. Symp. on Fault-Tolerant Computing (June 1976): 69 74. [NAKA05] M. Nakai, S. Akui, K. Seno, T. Meguro, T. Seki, T. Kondo, A. Hashiguchi, H. Kawahara, K. Kumano, and M. Shimura, Dynamic Voltage and Frequency Management for a Low-Power Embedded Microprocessor, IEEE J. Solid-State Circ., 40 (January 2005): 28 35. [NANY79] T. Nanya and Y. Tohma, Universal Multicode STT State Assignments for Asynchronous Sequential Machines, IEEE Trans. Comput., C-28 (November 1979): 811 818. [NANY83] T. Nanya and Y. Tohma, A 3-Level Realization of Totally Self-Checking Checkers for m-out-of-n Codes, Dig., 13th IEEE Int. Symp. on Fault-Tolerant Computing (1983): 173 176. [NANY85] T. Nanya and T. Hamamatsu, Totally Self-Checking Checkers for Subsets of m-out-of2m Codes (in Japanese), Trans. IECE Japan, J68-D (March 1985): 229 236. [NANY87] T. Nanya and T. Kawamura, A Note on Strongly Fault Secure Sequential Circuits, IEEE Trans. Comput., C-36 (September 1987): 1121 1123. [NANY88] T. Nanya and T. Kawamura, Error Secure / Error Propagating Concept and Its Application to Design of Strongly Fault Secure Processors, IEEE Trans. Comput., C-37 (January 1988): 14 24. [NEUM75] P. G. Neumann and T. R. N. Rao, Error-Correction Codes for Byte-Organized Arithmetic Processors, IEEE Trans. Comput., C-24 (March 1975): 226 232. [NICO84] M. Nicolaidis, I. Jansch, and B. Courtois, Strongly Code-Disjoint Checkers, Dig., 14th IEEE Int. Symp. on Fault-Tolerant Computing (June 1984): 16 21. [NICO85] M. Nicolaidis, Evaluation of a Self-Checking Version of the MC68000 Microprocessor, Dig., 15th IEEE Int. Symp. on Fault-Tolerant Computing (June 1985): 350 356. [OBER79] R. M. M. Oberman, Digital Circuits for Binary Arithmetic, Macmillian (1979).
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